Notice ID: dd96e5e5b43342f2a8c8899af4e24d7bAward NoticeAwardedArchived
Focused Ion Beam/Scanning Electron Microscope (FIB/SEM)
Awarded on March 27, 2026. The description is published on SAM.gov: Full description on SAM.gov.
Awarded tounder 1333ND26PNB030039 (source: SAM.gov award notice)• $4.5M
Overview
- Posted
- April 6, 2026
- Notice type
- Award Notice
- Set-aside
- No Set aside used
- NAICS
- 334516: Analytical Laboratory Instrument Manufacturing
- Agency
- Department of CommerceNATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY
Notice details
- Office
- DEPT OF COMMERCE NIST
- Place of performance
- Maryland, 20899
- PSC
- 5961: SEMICONDUCTOR DEVICES AND ASSOCIATED HARDWARE
- Last updated
- Nov 2, 2026
- First published
- Last updated on SAM.gov
- Award date
- Mar 27, 2026
- Award amount (SAM.gov award notice)
- $4.5M
Identifiers
- Solicitation number
- 1333ND26PNB030039
- Notice ID
- dd96e5e5b43342f2a8c8899af4e24d7b
- Award number (PIID)
- 1333ND26PNB030039
Description
No description in the SAM.gov data feed for this notice.
Award Overview
Award Number
1333ND26PNB030039
Award Amount (SAM.gov award notice)
$4.5M
Award Date
Mar 27, 2026
Awardee
Awardee UEI
CL4ELDSNT465
Awardee CAGE Code
1FJ95
Awardee Address
Hillsboro, OR 97124, UNITED STATES
Original Solicitation
Notice ID: dd96e5e5b43342f2a8c8899af4e24d7b
Posted Date: Apr 6, 2026
Original Response Deadline: Not specified
Contacts
Contracting Officer
Primary Contact
Nina Lin
Secondary Contact
Forest Crumpler
Documents
No documents available.
Lifecycle
- 3Version 3Award NoticeArchivedCurrent
Focused Ion Beam/Scanning Electron Microscope (FIB/SEM)
Similar Opportunities
Additional Details
Solicitation Number
1333ND26PNB030039
Archive Date
Apr 11, 2026
Office Address
GAITHERSBURG, MD, 20899