Notice ID: c7581827b97a4646a242778fd96a1049Combined Synopsis/SolicitationArchived
Focused Ion Beam Scanning Electron Microscope (FIB-SEM) Instrument
Archived on March 10, 2026. Original response deadline: . Full description on SAM.gov.
Overview
- Response deadline
- 4:30 PM EST
- Posted
- February 9, 2026
- Notice type
- Combined Synopsis/Solicitation
- Set-aside
- No Set aside used
- NAICS
- 334516: Analytical Laboratory Instrument Manufacturing
- Agency
- Department of CommerceNATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY
Notice details
- Office
- DEPT OF COMMERCE NIST
- Place of performance
- Gaithersburg, Maryland, 20899
- PSC
- 6640: LABORATORY EQUIPMENT AND SUPPLIES
- Last updated
- Nov 3, 2026
- First published
- Last updated on SAM.gov
Identifiers
- Solicitation number
- 1333ND26QNB030053
- Notice ID
- c7581827b97a4646a242778fd96a1049
Description
This National Institute of Standards and Technology (NIST) has a requirement for a Focused Ion Beam (FIB) and Scanning Electron Microscope (SEM) instrument capable of performing a suite of customized measurements. See attached Solicitation# 1333ND26QNB030053, and associated Attachments 1 (SOW) and 2 (Applicable Provisions and Clauses) for full details.
Award Overview
Contacts
Contracting Officer
Primary Contact
Nina Lin
Secondary Contact
Forest Crumpler
Documents
Files (3)
- Download
Solicitation 1333ND26QNB030053 FIB-SEM.docx
51 KBAdded in Combined Synopsis/Solicitation version 3Posted - Download
Attachment 1- Statement of Work FIB-SEM.docx
77 KBAdded in Combined Synopsis/Solicitation version 3Posted - Download
Attachment 2 - Applicable Provisions and Clauses.docx
55 KBAdded in Combined Synopsis/Solicitation version 3Posted
Lifecycle
- 3Version 3Combined Synopsis/SolicitationArchivedCurrent
Focused Ion Beam Scanning Electron Microscope (FIB-SEM) Instrument
Similar Opportunities
Additional Details
Solicitation Number
1333ND26QNB030053
Archive Date
Mar 10, 2026
Office Address
GAITHERSBURG, MD, 20899