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Notice ID: ddfe3e8d57564a8b91171326609bcaa5Combined Synopsis/Solicitation

Low temperature scanning NV microscope

Archived on March 27, 2026. Original response deadline: . Full description on SAM.gov.

Description

Low temperature scanning NV microscope

ORNL is requesting a quote for the same or domestic equivalent of a low temperature scanning nitrogen-vacancy center (NV) microscope to support fundamental research in nanoscience, condensed matter physics, and quantum information science. The microscope must include each the following capabilities and must meet the listed technical specifications:
1. Turnkey scanning NV microscopy demonstrated during the installation by vendor's service engineer(s): system must be capable of performing continuous wave and pulsed NV microscopy at time of delivery.
2. Delivery of a complete scanning NV microscope within 9 months.
3. 2/√ magnetic field sensitivity in continuous wave mode and 10nT/√Hz sensitivity in pulsed mode
4. Compatible with standard pulse sequences including Rabi, Ramsey, spin-echo, CPMG, and XYN measurements, and adaptable for use with customized user-defined pulse sequences.
5. Closed-cycle cooling for variable temperature operation at T=2-300K with 100 mK stability at all temperatures, cooldown time of less than 6 hours, and RMS z-noise of < 2.5 nm while cold.
6. 1/1/1 T magnet capable of operating at full field for sample temperatures of 1.8-300K.
7. Coarse positioning with at minimum 2 × 3 x 2.5 mm travel at T=2K.
8. Nanometric scanning with at minimum 18x18 microns travel at T=2K.
9. Cryo-objective with numerical aperture of >0.8.
10. Integrated microwave antenna with NV probe.
11. A minimum of 4 rf channels with less than 3dB insertion loss up to 6 GHz and a minimum of 8 low frequency channels accessible to the microscope stage, including sample mounts with dc and rf connections.
12. Open source Python control of all microscope components and flexible platform for hardware and software modifications to be performed by customer.
13. Integrated polar MOKE imaging.
14. One year warranty including all parts and service needed to guarantee microscope performance for first year after delivery.
15. Onsite training at time of delivery to include all necessary training for operation of scanning NV microscope as turnkey microscope.
 

Full description on SAM.gov

Overview

Agency:
Department of Energy
Office:ORNL UT-BATTELLE LLC-DOE CONTRACTOR
Posted:March 20, 2026
NAICS:541330: Engineering Services
Last Updated:Aug 21, 2026
PSC:6650: OPTICAL INSTRUMENTS, TEST EQUIPMENT, COMPONENTS AND ACCESSORIES
Set-Aside:Not specified
Type:Combined Synopsis/Solicitation
Place of Performance:Oak Ridge, Tennessee, 37830

Award Overview

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Primary Contact

Morgan Records

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Combined Synopsis/SolicitationENERGY, DEPARTMENT OFMar 20, 2026309.33 KB
Combined Synopsis/SolicitationENERGY, DEPARTMENT OFMar 20, 2026256.17 KB
Combined Synopsis/SolicitationENERGY, DEPARTMENT OFMar 20, 2026115.68 KB
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Combined Synopsis/SolicitationENERGY, DEPARTMENT OFMar 20, 2026935.2 KB

Lifecycle

Solicitation:PR450276
  1. Combined Synopsis
  1. 2×
    Combined SynopsisCurrentMar 19, 2026

    Low temperature scanning NV microscope

    Notice ddfe3e8d57564a8b91171326609bcaa5 on SAM.gov

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Additional Details

Solicitation Number

PR450276

Archive Date

Mar 27, 2026

Office Address

Oak Ridge, TN, 37831