Notice ID: 4856abefb1334d699737e03cc67ce1bbSolicitationArchived
Helios 600i Focused Ion Beam Scanning Electron Microscope Annual Maintenance for Watervliet Arsenal, NY
Archived on March 21, 2026. Original response deadline: . Full description on SAM.gov.
Overview
- Response deadline
- 3:00 PM EST
- Posted
- February 27, 2026
- Notice type
- Solicitation
- NAICS
- 811210: Electronic and Precision Equipment Repair and Maintenance
- Agency
- Department of WarDepartment of the Army
Notice details
- Office
- AMC.ACC.ACC-CTRS.ACC-DTA.W6QK ACC WVA
- Place of performance
- Watervliet, New York, 12189
- PSC
- J036: MAINT/REPAIR/REBUILD OF EQUIPMENT- SPECIAL INDUSTRY MACHINERY
- Last updated
- Nov 2, 2026
- First published
- Last updated on SAM.gov
Identifiers
- Solicitation number
- W911PT26QA041
- Notice ID
- 4856abefb1334d699737e03cc67ce1bb
Description
This solicitation is for the procurement of 1 LOT - Annual maintenance, support, repair and software updates to FEI Helios 600i Focused Ion Beam, (FIB) / Scanning Electron Microscope (SEM) Dual Beam per the attached Performance Work Statement (PWS) for Benet Laboratories. Wage Determination No.2015-4143 latest revision applies and is attached.
*** This is a Sole Source Procurement with FEI Company. All Responsible offerors will be considered. ***
Award Overview
Contacts
Contracting Officer
Primary Contact
Katja Fox
Documents
Files (1)
- Download
Solicitation - W911PT26QA041 Professional Appearance.pdf
3.2 MBAdded in Solicitation version 3Posted
Lifecycle
- 3Version 3SolicitationArchivedCurrent
Helios 600i Focused Ion Beam Scanning Electron Microscope Annual Maintenance for Watervliet Arsenal, NY
Similar Opportunities
Additional Details
Solicitation Number
W911PT26QA041
Archive Date
Mar 21, 2026
Office Address
WATERVLIET, NY, 12189-4050