Field-Emission Scanning Electron Microscope (FE‑SEM) System

Argonne National Laboratory is seeking to procure the below. Please refer to the Statement of Work, attached, for further details and requirements.

1. Field-Emission Scanning Electron Microscope (FE‑SEM) System
2. Installation and Testing

If able to provide the items listed above, please submit your proposal addressing the following requirements by January 30, 2026, at 5:00 PM CST.

For any questions, please contact jdoria@anl.gov no later than Januray 26, 2026, at 12:00 PM CST.

1. Signature on Page 1 of this document
2. Proposal - Vendor shall provide two (2) priced configurations:
   1. Base System (no ultra-fast beam blanker)
   2. Base System + Optional Ultra-Fast Beam Blanker (meeting the requirement above)
3. Lead Time
4. Shipping Origin
   • If shipping from outside the USA, please confirm Incoterms of DAP are accepted. Additionally, please provide the appropriateHTS Code associated with order
   • If shipping from within the USA, please confirm Incoterms FOB Destination are accepted and that the quoted price includes allcosts associated with the order, and it will be the final price at invoicing.
5. Country of Origin
6. ANL-70B (Complete)
7. Addendum 0001 (Review and Sign)
8. Addendum 0002 (Review)